HIGH PERFORMANCE MEMORY TESTING

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High Performance Memory Testing

Author : R. Dean Adams
ISBN : 9780306479724
Genre : Technology & Engineering
File Size : 67.18 MB
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Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Category: Technology & Engineering

High Performance Memory Systems

Author : Haldun Hadimioglu
ISBN : 038700310X
Genre : Computers
File Size : 47.69 MB
Format : PDF
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The State of Memory Technology Over the past decade there has been rapid growth in the speed of micropro cessors. CPU speeds are approximately doubling every eighteen months, while main memory speed doubles about every ten years. The International Tech nology Roadmap for Semiconductors (ITRS) study suggests that memory will remain on its current growth path. The ITRS short-and long-term targets indicate continued scaling improvements at about the current rate by 2016. This translates to bit densities increasing at two times every two years until the introduction of 8 gigabit dynamic random access memory (DRAM) chips, after which densities will increase four times every five years. A similar growth pattern is forecast for other high-density chip areas and high-performance logic (e.g., microprocessors and application specific inte grated circuits (ASICs)). In the future, molecular devices, 64 gigabit DRAMs and 28 GHz clock signals are targeted. Although densities continue to grow, we still do not see significant advances that will improve memory speed. These trends have created a problem that has been labeled the Memory Wall or Memory Gap.
Category: Computers

An Engineer S Guide To Automated Testing Of High Speed Interfaces Second Edition

Author : Jose Moreira
ISBN : 9781608079865
Genre : Technology & Engineering
File Size : 21.54 MB
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This second edition of An Engineer's Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing.
Category: Technology & Engineering

Multi Run Memory Tests For Pattern Sensitive Faults

Author : Ireneusz Mrozek
ISBN : 9783319912042
Genre : Technology & Engineering
File Size : 26.24 MB
Format : PDF, ePub
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This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations.
Category: Technology & Engineering

High Performance Memories

Author : Betty Prince
ISBN : 0471986100
Genre : Computers
File Size : 80.62 MB
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High Performance Memories New architecture DRAMs and SRAMs evolution and function Revised Edition Betty Prince Memory Strategies International, Leander, Texas, USA Now presenting extra product specific material on the new DDR SDRAMs, ESDRAMs and DDR ESDRAMs, Direct Rambus DRAMs, SLDRAM, VCDRAM, SGRAM and DDR SGRAM, and DP-DRAM. Fully updated to incorporate the latest industry achievements in this fast-moving field, High Performance Memories, Revised provides an overview of the issues involved in advanced memory design. Drawing on her work at the cutting edge of memory technology, Prince surveys the latest trends in development and assesses the range of memory devices and systems available. New features include: * Examination of the latest DRAMs standards * Discussion of electrical characteristics of high speed memories including SSTL interfaces and techniques in the testing of fast RAMS * Coverage of the effect of packaging on memory speed, encompassing DDR DRAM, DR-DRAM and SLDRAM Written by an internationally respected author, this comprehensively revised edition will be a boon to practising engineers involved in the design and manufacture of high speed systems and semiconductor memories. Advanced students of electrical engineering and researchers in computing and telecommunications will find High Performance Memories, Revised an invaluable reference.
Category: Computers

Advanced Test Methods For Srams

Author : Alberto Bosio
ISBN : 1441909389
Genre : Technology & Engineering
File Size : 58.36 MB
Format : PDF
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Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.
Category: Technology & Engineering

Ieee Vlsi Test Symposium

Author :
ISBN : UOM:39015058299242
Genre : Application-specific integrated circuits
File Size : 47.90 MB
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Category: Application-specific integrated circuits

Proceedings

Author :
ISBN : UOM:39015039945509
Genre : Computer storage devices
File Size : 71.1 MB
Format : PDF
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Category: Computer storage devices

Advances In Electronic Testing

Author : Dimitris Gizopoulos
ISBN : 9780387294094
Genre : Technology & Engineering
File Size : 76.92 MB
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This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
Category: Technology & Engineering