HIGH PERFORMANCE MEMORY TESTING

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High Performance Memory Testing

Author : R. Dean Adams
ISBN : 9780306479724
Genre : Technology & Engineering
File Size : 75.56 MB
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Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Category: Technology & Engineering

High Performance Memory Systems

Author : Haldun Hadimioglu
ISBN : 9781441989871
Genre : Computers
File Size : 24.93 MB
Format : PDF
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The State of Memory Technology Over the past decade there has been rapid growth in the speed of micropro cessors. CPU speeds are approximately doubling every eighteen months, while main memory speed doubles about every ten years. The International Tech nology Roadmap for Semiconductors (ITRS) study suggests that memory will remain on its current growth path. The ITRS short-and long-term targets indicate continued scaling improvements at about the current rate by 2016. This translates to bit densities increasing at two times every two years until the introduction of 8 gigabit dynamic random access memory (DRAM) chips, after which densities will increase four times every five years. A similar growth pattern is forecast for other high-density chip areas and high-performance logic (e.g., microprocessors and application specific inte grated circuits (ASICs)). In the future, molecular devices, 64 gigabit DRAMs and 28 GHz clock signals are targeted. Although densities continue to grow, we still do not see significant advances that will improve memory speed. These trends have created a problem that has been labeled the Memory Wall or Memory Gap.
Category: Computers

An Engineer S Guide To Automated Testing Of High Speed Interfaces Second Edition

Author : Jose Moreira
ISBN : 9781608079865
Genre : Technology & Engineering
File Size : 34.90 MB
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This second edition of An Engineer's Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing.
Category: Technology & Engineering

Advances In Electronic Testing

Author : Dimitris Gizopoulos
ISBN : 9780387294094
Genre : Technology & Engineering
File Size : 69.55 MB
Format : PDF
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This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
Category: Technology & Engineering

Advanced Test Methods For Srams

Author : Alberto Bosio
ISBN : 1441909389
Genre : Technology & Engineering
File Size : 85.35 MB
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Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.
Category: Technology & Engineering

Cmos Sram Circuit Design And Parametric Test In Nano Scaled Technologies

Author : Andrei Pavlov
ISBN : 9781402083631
Genre : Technology & Engineering
File Size : 58.64 MB
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The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.
Category: Technology & Engineering

Testing Static Random Access Memories

Author : Said Hamdioui
ISBN : 1402077521
Genre : Technology & Engineering
File Size : 83.56 MB
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Embedded memories are one of the fastest growing segments oftoday's new technology market. According to the 2001 InternationalTechnology Roadmap for Semiconductors, embedded memories will continueto dominate the increasing system on chip (SoC) content in the nextseveral years, approaching 94% of the SoC area in about 10 years.Furthermore, the shrinking size of manufacturing structures makesmemories more sensitive to defects. Consequently, the memory yieldwill have a dramatic impact on the overall Defect-per-million level, hence on the overall SoC yield. Meeting a high memory yield requiresunderstanding memory designs, modeling their faulty behaviors, designing adequate tests and diagnosis algorithms as well as efficientself-test and repair schemes."Testing Static Random Access Memories" covers testing of one ofthe important semiconductor memories types; it address testing ofstatic random access memories (SRAMs), both single-port andmulti-port. It contributes to the technical acknowledge needed bythose involved in memory testing, engineers and researchers. The bookbegins with outlining the most popular SRAMs architectures. Then, thedescription of realistic fault models, based on defect injection andSPICE simulation, are introduced. Thereafter, high quality and lowcost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with somepreliminary test results showing the importance of the new tests inreducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies isalso discussed.Features:
Category: Technology & Engineering

Essentials Of Electronic Testing For Digital Memory And Mixed Signal Vlsi Circuits

Author : M. Bushnell
ISBN : 0792379918
Genre : Technology & Engineering
File Size : 60.99 MB
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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.
Category: Technology & Engineering

Ieee Vlsi Test Symposium

Author :
ISBN : UOM:39015058299242
Genre : Application-specific integrated circuits
File Size : 87.72 MB
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Category: Application-specific integrated circuits

Communication Systems And Information Technology

Author : Ming Ma
ISBN : 9783642217623
Genre : Technology & Engineering
File Size : 87.33 MB
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This volume includes extended and revised versions of a set of selected papers from the International Conference on Electric and Electronics (EEIC 2011) , held on June 20-22 , 2011, which is jointly organized by Nanchang University, Springer, and IEEE IAS Nanchang Chapter. The objective of EEIC 2011 Volume 4 is to provide a major interdisciplinary forum for the presentation of new approaches from Communication Systems and Information Technology, to foster integration of the latest developments in scientific research. 137 related topic papers were selected into this volume. All the papers were reviewed by 2 program committee members and selected by the volume editor Prof. Ming Ma. We hope every participant can have a good opportunity to exchange their research ideas and results and to discuss the state of the art in the areas of the Communication Systems and Information Technology.
Category: Technology & Engineering